§Different types of test signals have been developed, providing good immunity to background noise and
easy deconvolution
of the impulse response:
►MLS (Maximum Lenght Sequence, pseudo-random white
noise)
►TDS (Time Delay Spectrometry, which basically is simply
a linear sine sweep,
also known in Japan as “stretched pulse” and in Europe as “chirp”)
►ESS (Exponential Sine Sweep)
§Each of these test signals can be employed with
different deconvolution
techniques, resulting in a number of “different” measurement methods
§Due to theoretical and practical considerations, the preference is nowadays generally oriented for
the usage of ESS
with not-circular deconvolution
►